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Effect of Cu Dopant on the Electrical Property of ZnO Thin Films Deposited by Pulsed Laser Deposition

Journal Solid State Phenomena (Volumes 124 - 126)
Volume Advances in Nanomaterials and Processing
Edited by Byung Tae Ahn, Hyeongtag Jeon, Bo Young Hur, Kibae Kim and Jong Wan Park
Pages 339-342
DOI 10.4028/www.scientific.net/SSP.124-126.339
Citation Gun Hee Kim et al., 2007, Solid State Phenomena, 124-126, 339
Online since June, 2007
Authors Gun Hee Kim, Hong Seong Kang, Dong Lim Kim, Hyun Woo Chang, Byung Du Ahn, Sang Yeol Lee
Keywords Cu Doped ZnO, Photoluminescence (PL), Pulsed Laser Deposition
Abstract

Cu-doped ZnO (denoted by ZnO:Cu) films have been prepared by pulsed laser deposition using 3 wt. CuO doped ZnO ceramic target. The carrier concentrations (1011~1018 cm-3) and, electrical resistivity (10-1~105  cm) of deposited Cu-doped ZnO thin films were varied depending on deposition conditions. Variations of electrical properties of Cu-doped ZnO indicate that copper dopants may play an important role in determining their electrical properties, compared with undoped films. To investigate effects of copper dopants on the properties of ZnO thin films, X-Ray diffraction (XRD), photoluminescence (PL), and Hall measurements have been performed and corresponded.

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