Failure Mechanism of Patterned ITO Electrodes on Flexible Substrate under Static and Dynamic Mechanical Stresses |
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| Journal | Solid State Phenomena (Volumes 124 - 126) |
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| Volume | Advances in Nanomaterials and Processing |
| Edited by | Byung Tae Ahn, Hyeongtag Jeon, Bo Young Hur, Kibae Kim and Jong Wan Park |
| Pages | 411-414 |
| DOI | 10.4028/www.scientific.net/SSP.124-126.411 |
| Citation | Jeong Seob Oh et al., 2007, Solid State Phenomena, 124-126, 411 |
| Online since | June, 2007 |
| Authors | Jeong Seob Oh, Young Rae Cho, Ko Eun Cheon, Md.A. Karim, Seung Jin Jung |
| Keywords | Failure Mechanism, Flexible Display, OLED, Patterned ITO Electrodes |
| Abstract | The mechanism of failure of patterned ITO electrodes on PET was investigated under static and cyclic bending in the mechanical stress mode. When mechanical stresses are increased, two types of micro-cracks are observed depending on the stress modes. The direction of the micro-crack in ITO electrodes is perpendicular to the load for the static mode. The electrical resistance of an ITO electrode is related to the density of the micro-cracks and failure mechanism of ITO electrode. |
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