Full Pattern Methods for the Analysis of Plastically Deformed Materials |
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| Journal | Solid State Phenomena (Volume 130) |
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| Volume | APPLIED CRYSTALLOGRAPHY XX |
| Edited by | Danuta Stróż & Małgorzata Karolus |
| Pages | 27-32 |
| DOI | 10.4028/www.scientific.net/SSP.130.27 |
| Citation | Paolo Scardi et al., 2007, Solid State Phenomena, 130, 27 |
| Online since | December, 2007 |
| Authors | Paolo Scardi, Matteo Leoni, Mirco D'Incau |
| Keywords | Domain Size Distribution, Lattice Defect, Line Profile Analysis, Powder Diffraction, Whole-Powder-Pattern Modelling, X-Ray Diffraction (XRD) |
| Abstract | The recent evolution of powder diffraction line profile analysis toward full pattern methods is discussed. Specific reference is made to the Whole Powder Pattern Modelling (WPPM), as applied to metals and ceramics subjected to strong plastic deformation. Examples concerning three different materials science studies are shown to illustrate features and potentialities of the WPPM approach. |
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