Lattice and Peak Profile Parameters in GIXD Technique |
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| Journal | Solid State Phenomena (Volume 130) |
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| Volume | APPLIED CRYSTALLOGRAPHY XX |
| Edited by | Danuta Stróż & Małgorzata Karolus |
| Pages | 281-286 |
| DOI | 10.4028/www.scientific.net/SSP.130.281 |
| Citation | Tomasz Goryczka et al., 2007, Solid State Phenomena, 130, 281 |
| Online since | December, 2007 |
| Authors | Tomasz Goryczka, Grzegorz Dercz, Lucjan Pająk, Eugeniusz Łągiewka |
| Keywords | GIXD, LeBail Refinement, X-Ray Diffraction (XRD) |
| Abstract | Grazing incident X-ray diffraction technique was applied to determine the influence of incident beam angle (α angle) on structural parameters as well as peak profile. X-ray diffraction patterns were registered in asymmetrical geometry, in which a parallel beam was formed by Soller and divergence slits. Lowering of the α angle results in accuracy decrease of lattice parameters as well as in significant broadening of a half-width of X-ray diffraction line. |
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