Paper Title:
Lattice and Peak Profile Parameters in GIXD Technique
  Abstract

Grazing incident X-ray diffraction technique was applied to determine the influence of incident beam angle (α angle) on structural parameters as well as peak profile. X-ray diffraction patterns were registered in asymmetrical geometry, in which a parallel beam was formed by Soller and divergence slits. Lowering of the α angle results in accuracy decrease of lattice parameters as well as in significant broadening of a half-width of X-ray diffraction line.

  Info
Periodical
Solid State Phenomena (Volume 130)
Edited by
Danuta Stróż & Małgorzata Karolus
Pages
281-286
DOI
10.4028/www.scientific.net/SSP.130.281
Citation
T. Goryczka, G. Dercz, L. Pająk, E. Łągiewka, "Lattice and Peak Profile Parameters in GIXD Technique", Solid State Phenomena, Vol. 130, pp. 281-286, 2007
Online since
December 2007
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Price
$32.00
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