Applications of High-Resolution Powder X-Ray Diffraction |
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| Journal | Solid State Phenomena (Volume 130) |
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| Volume | APPLIED CRYSTALLOGRAPHY XX |
| Edited by | Danuta Stróż & Małgorzata Karolus |
| Pages | 7-14 |
| DOI | 10.4028/www.scientific.net/SSP.130.7 |
| Citation | Andrew N. Fitch, 2007, Solid State Phenomena, 130, 7 |
| Online since | December, 2007 |
| Authors | Andrew N. Fitch |
| Keywords | High Throughput, In Situ Studies, Strain Measurements, Structural Analysis, Synchroton Radiation, X-Ray Powder Diffraction |
| Abstract | The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components. |
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