Paper Title:
X-Ray Analysis of the Cd0.5Ge0.5Cr2Se4 and CdCr1.9Ge0.075Se4 Compounds
  Abstract

The polycrystalline Cd0.5Ge0.5Cr2Se4 and CdCr1.9Ge0.075Se4 compounds were obtained using ceramic method. X-ray analysis was used to make phase and structure analysis. The Rietveld method was applied for structure refinement. Both compounds crystallized in cubic, normal spinel structure, Fd 3m. Besides the main spinel phase, Cr2Se3 was observed.

  Info
Periodical
Solid State Phenomena (Volume 130)
Edited by
Danuta Stróż & Małgorzata Karolus
Pages
93-96
DOI
10.4028/www.scientific.net/SSP.130.93
Citation
E. Maciążek, T. Goryczka, I. Jendrzejewska, "X-Ray Analysis of the Cd0.5Ge0.5Cr2Se4 and CdCr1.9Ge0.075Se4 Compounds", Solid State Phenomena, Vol. 130, pp. 93-96, 2007
Online since
December 2007
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