Paper Title:
Degradation and their Recovery Behavior of Irradiated GaAlAs LEDs
  Abstract

The degradation and recovery behavior of device performance on GaAlAs LEDs (Light emitting diodes) irradiated by 2-MeV electrons and 70-MeV protons are investigated. The reverse current increases after irradiation, while the capacitance decreases. The device performance degradation is proportional with fluence. For electron irradiation, fluence rate is also effective for degradation. Low fluence rate shows more large degradation compared to high fluence rate resulting from heat impact in bulk. DLTS measurement reveals the DX center in epitaxial substrate, and this spectrum increases with fluence. The radiation damage of proton is larger than that of electron irradiation, which is caused by the difference of mass and possibility of nuclear collision for the formation of lattice defects. After irradiation, the device performance recovers by thermal annealing.

  Info
Periodical
Solid State Phenomena (Volumes 131-133)
Edited by
A. Cavallini, H. Richter, M. Kittler and S. Pizzini
Pages
119-124
DOI
10.4028/www.scientific.net/SSP.131-133.119
Citation
H. Ohyama, K. Takakura, T. Nagano, M. Hanada, S. Kuboyama, E. Simoen, C. Claeys, "Degradation and their Recovery Behavior of Irradiated GaAlAs LEDs", Solid State Phenomena, Vols. 131-133, pp. 119-124, 2008
Online since
October 2007
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Vitalii V. Kozlovski, Alexander A. Lebedev, Elena V. Bogdanova, Natalia. V. Seredova
Chapter II: Fundamental and Characterization of SiC
Abstract:Effects of electron irradiation in n-4H-SiC have been studied by the methods of the capacitance--voltage characteristics and...
293
Authors: Pavel Hazdra, Stanislav Popelka, Vít Zahlava
Chapter IV: SiC Devices and Circuits
Abstract:Commercial 1200V and 1700V MPS diodes and 1700V vertical JFETs produced on 4H-SiC n-type epilayers were neutron irradiated with fluences up...
785