Paper Title:
Electrical Activation and Carrier Compensation in Si and Mg Implanted GaN by Scanning Capacitance Microscopy
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Periodical
Solid State Phenomena (Volumes 131-133)
Edited by
A. Cavallini, H. Richter, M. Kittler and S. Pizzini
Pages
491-496
DOI
10.4028/www.scientific.net/SSP.131-133.491
Citation
F. Giannazzo, F. Iucolano, F. Roccaforte, L. Romano, M. G. Grimaldi, V. Raineri, "Electrical Activation and Carrier Compensation in Si and Mg Implanted GaN by Scanning Capacitance Microscopy", Solid State Phenomena, Vols. 131-133, pp. 491-496, 2008
Online since
October 2007
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