Paper Title:
Hydrogenated Nanocrystalline Silicon Thin Films Studied by Scanning Force Microscopy.
  Abstract

Hydrogenated nanocrystalline silicon for photovoltaic applications has been investigated. Morphological properties, as well as electrical properties, have been investigated with high spatial resolution by scanning force microscopy analyses (AFM, Atomic Force Microscopy and C-AFM conductive AFM). A major problem regarding the electronic properties is to understand where the current flows. The present contribution aims to clarify which of the material phases mainly contributes to the conduction mechanism.

  Info
Periodical
Solid State Phenomena (Volumes 131-133)
Edited by
A. Cavallini, H. Richter, M. Kittler and S. Pizzini
Pages
547-552
DOI
10.4028/www.scientific.net/SSP.131-133.547
Citation
D. Cavalcoli, M. Rossi, A. Tomasi, A. Cavallini, D. Chrastina, G. Isella, "Hydrogenated Nanocrystalline Silicon Thin Films Studied by Scanning Force Microscopy.", Solid State Phenomena, Vols. 131-133, pp. 547-552, 2008
Online since
October 2007
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Price
$32.00
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