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The Unusual Temperature Shift of Dislocation Related D1/D2 PL Bands in Donor Doped Silicon

Journal Solid State Phenomena (Volumes 131 - 133)
Volume Gettering and Defect Engineering in Semiconductor Technology XII
Edited by A. Cavallini, H. Richter, M. Kittler and S. Pizzini
Pages 607-612
DOI 10.4028/www.scientific.net/SSP.131-133.607
Citation E.A. Steinman et al., 2007, Solid State Phenomena, 131-133, 607
Online since October, 2007
Authors E.A. Steinman, A.N. Tereshchenko, Nikolay V. Abrosimov
Keywords Dislocations, Impurities, PL, Silicon
Abstract

The samples of p- and n-doped Fz Si were deformed in 3-point bending mode in the temperature range 800-950flC. Dislocation related PL (DRL) spectra were measured at temperature in the range 4.2 – 200K. Several features of DRL turned out to be sensitive to donor level doping. First, the low energy components of D1/D2 bands disappear at middle and high doping level. Second, the intensity of D1 band showed much more dependence on the donor doping level than other DRL bands and almost disappeared at the concentration of donors around 1017cm-3. Finally, it has been found that the temperature variation of the D1/D2 line positions depend on the donor doping level. Namely, at the donor concentration higher than 1015cm-3 the D1/D2 bands demonstrate the blue shift when the sample temperature goes up from 4K. At higher temperature the band positions more or less follow the temperature behavior of the band gap. The effect does not depend on chemical nature of donor except a value of ionization energy. No such behavior has been observed for different levels of acceptor doping. Taking into account that the ionization of shallow donors happens in the temperature range of above 30K, the effect of blue shift has been attributed to the influence of free electrons released from donors.

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