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Ex Situ Bubble Generation, Enhancing the Particle Removal Rate for Single Wafer Megasonic Cleaning Processes

Journal Solid State Phenomena (Volume 134)
Volume Ultra Clean Processing of Semiconductor Surfaces VIII
Edited by Paul Mertens, Marc Meuris and Marc Heyns
Pages 201-204
DOI 10.4028/www.scientific.net/SSP.134.201
Citation Frank Holsteyns et al., 2007, Solid State Phenomena, 134, 201
Online since November, 2007
Authors Frank Holsteyns, Tom Janssens, Sophia Arnauts, Wouter Van der Putte, Vincent Minsier, Johann Brunner, Joachim Straka, Paul W. Mertens
Keywords Bubble Generation, Cavitation, Megasonic, Nozzle
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