Paper Title:
Estimation of Detrimental Impact of New Metal Candidates in Advanced Microelectronics
  Abstract

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Periodical
Solid State Phenomena (Volume 134)
Edited by
Paul Mertens, Marc Meuris and Marc Heyns
Pages
247-250
DOI
10.4028/www.scientific.net/SSP.134.247
Citation
Y. Borde, A. Danel, A. Roche, A. Grouillet, M. Veillerot, "Estimation of Detrimental Impact of New Metal Candidates in Advanced Microelectronics", Solid State Phenomena, Vol. 134, pp. 247-250, 2008
Online since
November 2007
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$32.00
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