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Surface Microroughness of Silicon in Wet Process and its Minimization

Journal Solid State Phenomena (Volume 134)
Volume Ultra Clean Processing of Semiconductor Surfaces VIII
Edited by Paul Mertens, Marc Meuris and Marc Heyns
Pages 45-48
DOI 10.4028/www.scientific.net/SSP.134.45
Citation Hitoshi Morinaga et al., 2007, Solid State Phenomena, 134, 45
Online since November, 2007
Authors Hitoshi Morinaga, Kenji Shimaoka, Tadahiro Ohmi
Keywords Microroughness, Photoinduced Oxidation, Photoinduced Roughness
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