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Development of a New TaN Etchant for Metal Gate

Journal Solid State Phenomena (Volume 134)
Volume Ultra Clean Processing of Semiconductor Surfaces VIII
Edited by Paul Mertens, Marc Meuris and Marc Heyns
Pages 75-78
DOI 10.4028/www.scientific.net/SSP.134.75
Citation Mong Sup Lee et al., 2007, Solid State Phenomena, 134, 75
Online since November, 2007
Authors Mong Sup Lee, Sang Yong Kim, Ji Hoon Cha, Jeong Nam Han, Im Soo Park, Kun Tack Lee, Chang Ki Hong, Han Ku Cho, Joo Tae Moon
Keywords High-k Layer, Metal Gate, TaN, Wet Etching Processes
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