Paper Title:
Method of Dynamic Parameters Measurement of High-Speed DAC's
  Abstract

Developed sampling device and algorithm of digital signal processing for automated measurement of settling times of fast DACs is represented. The new sampling device with numerically controlled oscillators allows realizing of the different types of the time scale transformation. Using of sigma-delta ADC and FIFO memory allows significant simplification of the device. The equations of time scale transformation ratio and sampling step are presented. Results of the research of developed digital signal processing algorithm are submitted.

  Info
Periodical
Solid State Phenomena (Volume 144)
Edited by
Inga Skiedraite and Jolanta Baskutiene
Pages
157-162
DOI
10.4028/www.scientific.net/SSP.144.157
Citation
V. Kvedaras, R. Kvedaras, T. Ustinavičius, "Method of Dynamic Parameters Measurement of High-Speed DAC's", Solid State Phenomena, Vol. 144, pp. 157-162, 2009
Online since
September 2008
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$32.00
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