Materials Science & Technology

FULLTEXT SEARCH
NEW: Advanced Search

Photoresist Adhesion during Wet Etch on Single Wafer Tool

Journal Solid State Phenomena (Volumes 145 - 146)
Volume Ultra Clean Processing of Semiconductor Surfaces IX
Edited by Paul Mertens, Marc Meuris and Marc Heyns
Pages 219-222
DOI 10.4028/www.scientific.net/SSP.145-146.219
Citation Philippe Garnier et al., 2009, Solid State Phenomena, 145-146, 219
Online since January, 2009
Authors Philippe Garnier, B. Pernet, Y. Gomez, C. Duluard, Alphonse Torres, David Barge, M. Gatefait, Didier Lévy
Keywords Dual Gate Oxide, Photoresist Lift Off, Priming, Single Wafer Tool
Abstract

Integrating multiple gate oxides on a same die requires a proper definition of their respective active area (fig. 1). First the thick gate oxide is grown, and covered by some photoresist. Then a wet etch removes this oxide on the die areas where the resist has been developed. Finally, after resist stripping and surface cleaning, the thin gate oxide is grown. The interaction between the thick oxide surface, the resist and the etchant makes the wet etch challenging. This paper deals with some characterizations and solutions to improve this process.

Full Paper PDF Get the full paper by clicking here

First page example

Preview of first page