The Influence of Standing Waves on Cleaning with a Megasonic Nozzle |
|
| Journal | Solid State Phenomena (Volumes 145 - 146) |
|---|---|
| Volume | Ultra Clean Processing of Semiconductor Surfaces IX |
| Edited by | Paul Mertens, Marc Meuris and Marc Heyns |
| Pages | 23-26 |
| DOI | 10.4028/www.scientific.net/SSP.145-146.23 |
| Citation | Tom Janssens et al., 2009, Solid State Phenomena, 145-146, 23 |
| Online since | January, 2009 |
| Authors | Tom Janssens, G. Doumen, S. Halder, Kurt Wostyn, Paul W. Mertens, Joachim Straka |
| Keywords | Cavitation, Physical Cleaning |
| Abstract | A non uniform sound field distribution can be a problem in a megasonic cleaning system, since a higher sound intensity can cause damage, while areas exposed to a lower intensity will be insufficiently cleaned. These non uniformities can be the result of sound field reflection, leading to standing waves, and the interference related to the near field. In a single wafer tool with a transducer facing the wafer a small height difference will have a large impact on the cleaning efficiency if standing waves are present. Here we study the impact of the wafer transducer height in a cleaning system using a megasonic nozzle above a rotating wafer. |
| Full Paper |
Get the full paper by clicking here
|
