Paper Title:
X-Ray Diagnostics of Magnetic Semiconductor Quantum Well Structures
  Abstract

In the present contribution the results of the high-resolution X-ray diffraction and X-ray glancing-incidence mirror reflection studies of structural characteristics of the quantum-well GaAs/Ga1-xInxAs/GaAs diluted magnetic semiconductors (DMSC) are presented. The influence of the real structure of the samples on their electro-physical properties is discussed.

  Info
Periodical
Solid State Phenomena (Volumes 152-153)
Edited by
N. Perov
Pages
537-540
DOI
10.4028/www.scientific.net/SSP.152-153.537
Citation
I.A. Likhachev, E.M. Pashaev, M. A. Chuev, I.A. Subbotin, V.V. Kvardkov, B.A. Aronzon, V.V. Rylkov, A.Y. Golovanov, M.A. Pankov, "X-Ray Diagnostics of Magnetic Semiconductor Quantum Well Structures", Solid State Phenomena, Vols. 152-153, pp. 537-540, 2009
Online since
April 2009
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$32.00
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