Paper Title:
Thickness Dependence of Surface and Interface Phonon-Polariton Modes in InN/AlN Nanolayers
  Abstract

We study the conditions for appearance and observation of surface and interface phonon-polariton (SPP and IPP) modes in thin InN layers grown on sapphire using AlN buffer. Theoretical dispersion relations of the IPP modes in the system air/InN/AlN/sapphire for different thickness of the InN layer are obtained. Features in the experimentally measured infrared reflectance were associated with the appearance of interface phonon-polariton excitations at wave-numbers between the TO and LO modes.

  Info
Periodical
Solid State Phenomena (Volume 159)
Edited by
Lilyana Kolakieva and Roumen Kakanakov
Pages
77-80
DOI
10.4028/www.scientific.net/SSP.159.77
Citation
E. Valcheva, M. Baleva, G. Zlateva, "Thickness Dependence of Surface and Interface Phonon-Polariton Modes in InN/AlN Nanolayers", Solid State Phenomena, Vol. 159, pp. 77-80, 2010
Online since
January 2010
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