Paper Title:
EBSD-Based Dislocation Microscopy
  Abstract

Recent advances in high-resolution electron backscatter diffraction (EBSD)-based microscopy are applied to the characterization of incompatibility structures near the grain boundaries (GBs) in polycrystals. The principal interest described here is recovery of geometrically-necessary dislocation (density) tensors, of the 2- and 3-D type, described by Nye and Kröner. These developments are presented in the context of the continuum dislocation theory. High resolution data obtained near a single grain boundary in well-annealed, low content steel suggests that it may be possible to measure the intrinsic elastic properties of GBs.

  Info
Periodical
Solid State Phenomena (Volume 160)
Edited by
H. Klein and R.A. Schwarzer
Pages
3-10
DOI
10.4028/www.scientific.net/SSP.160.3
Citation
B. L. Adams, C. J. Gardner, D. T. Fullwood, "EBSD-Based Dislocation Microscopy", Solid State Phenomena, Vol. 160, pp. 3-10, 2010
Online since
February 2010
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Price
$32.00
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