Paper Title:

Crystallite Size Determination of MgO Nanopowder from X-Ray Diffraction Patterns Registered in GIXD Technique

Periodical Solid State Phenomena (Volume 163)
Main Theme Applied Crystallography XXI
Edited by Danuta Stróż & Małgorzata Karolus
Pages 177-182
DOI 10.4028/
Citation Tomasz Goryczka et al., 2010, Solid State Phenomena, 163, 177
Online since June 2010
Authors Tomasz Goryczka, Grzegorz Dercz, Krystian Prusik, Lucjan Pająk, Eugeniusz Łągiewka
Keywords GIXD, MgO, Nanocrystalline Material, Rietveld Refinement, X-Ray Diffraction (XRD)
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The problem of the crystallite size determination for nanomaterials from X-ray diffraction data obtained in asymmetrical GIXD geometry was analyzed. The studies were performed on nanocrystalline MgO powder prepared by sol-gel synthesis. The nanopowder was preliminary characterized from X-ray diffraction pattern registered in classical Bragg-Brentano geometry and electron microscope observation. The estimated crystallite size, calculated form Williamson-Hall method, equals to 5 nm whereas the lattice distortion is negligible (0.1%). The X-ray diffraction patterns were registered in 30-135º 2θ range using tunnel GIXD technique for the incident α angle: 0.25; 0.5; 1; 2.5 and 5 degrees, respectively. Additional broadening of diffraction lines originated from applied geometry was observed. The calculated crystallite size deviate significantly in comparison to results obtained from classical Bragg-Brentano data. Corrections for additional line broadening were determined, which should be applied for accurate crystallite size calculation in studies of thin nanocrystalline layers using GIXD technique.