Paper Title:
The Mechanism of Defects Formation in Silicon Substrates
  Abstract

Components of navigating devices can be affected by acoustic emission and vibration. Therefore prototype samples and electronic components must be tested in such conditions. Heterostructures, which destructed under the action of external physical factors and kinetics of formations of porous defects in silicon substrates, were analyzed.

  Info
Periodical
Solid State Phenomena (Volume 165)
Edited by
Andrejus H. Marcinkevičius and Algirdas V.Valiulis
Pages
7-12
DOI
10.4028/www.scientific.net/SSP.165.7
Citation
A. Bogorosh, S. Voronov, N. Višniakov, D. Ščekaturovienė, A. Bubulis, "The Mechanism of Defects Formation in Silicon Substrates", Solid State Phenomena, Vol. 165, pp. 7-12, 2010
Online since
June 2010
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$32.00
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