Paper Title:

The Mechanism of Defects Formation in Silicon Substrates

Periodical Solid State Phenomena (Volume 165)
Main Theme Mechatronic Systems and Materials: Materials Production Technologies
Edited by Andrejus H. Marcinkevičius and Algirdas V.Valiulis
Pages 7-12
DOI 10.4028/www.scientific.net/SSP.165.7
Citation A. Bogorosh et al., 2010, Solid State Phenomena, 165, 7
Online since June, 2010
Authors A. Bogorosh, S. Voronov, N. Višniakov, D. Ščekaturovienė, Algimantas Bubulis
Keywords Defect Formation, Heterostructures on Silicon Substrate, Nanocrack, Navigating Electronic Device
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Abstract

Components of navigating devices can be affected by acoustic emission and vibration. Therefore prototype samples and electronic components must be tested in such conditions. Heterostructures, which destructed under the action of external physical factors and kinetics of formations of porous defects in silicon substrates, were analyzed.