CEMS Analysis of Phase Formation in Nanostructured Films (Fe/Si)3 |
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| Journal | Solid State Phenomena (Volumes 168 - 169) |
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| Volume | Trends in Magnetism |
| Edited by | V. Ustinov |
| Pages | 277-280 |
| DOI | 10.4028/www.scientific.net/SSP.168-169.277 |
| Citation | S.N. Varnakov et al., 2010, Solid State Phenomena, 168-169, 277 |
| Online since | December, 2010 |
| Authors | S.N. Varnakov, S.G. Ovchinnikov, J. Bartolomé, J. Rubín, L. Badía, G.V. Bondarenko |
| Keywords | Interfaces Metal, Interfaces Semiconductor, Magnetic Geterostructures, Magnetic Silicides, Molecular Beam Epitaxy Technology, Semiconductor Heterostructures |
| Abstract | Determination of stable phases formed at the Fe/Si interface in (Fe/Si)n structure, grown by thermal evaporation in an ultrahigh vacuum system was performed using conversion electron Mössbauer spectroscopy (CEMS). |
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