Paper Title:
CEMS Analysis of Phase Formation in Nanostructured Films (Fe/Si)3
  Abstract

Determination of stable phases formed at the Fe/Si interface in (Fe/Si)n structure, grown by thermal evaporation in an ultrahigh vacuum system was performed using conversion electron Mössbauer spectroscopy (CEMS).

  Info
Periodical
Solid State Phenomena (Volumes 168-169)
Main Theme
Edited by
V. Ustinov
Pages
277-280
DOI
10.4028/www.scientific.net/SSP.168-169.277
Citation
S.N. Varnakov, S.G. Ovchinnikov, J. Bartolomé, J. Rubín, L. Badía, G.V. Bondarenko, "CEMS Analysis of Phase Formation in Nanostructured Films (Fe/Si)3", Solid State Phenomena, Vols. 168-169, pp. 277-280, 2011
Online since
December 2010
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