Paper Title:
Scanning X-Ray Excited Optical Luminescence Microscopy as a New Tool for the Analysis of Recombination Active Defects in Multi-Crystalline Silicon
  Abstract

The results of investigations of solar grade mc-Si by means of combination of scanning X-ray beam excited optical luminescence microscopy (SXEOL), X-ray beam induced current (XBIC) and X-ray fluorescence (XRF) are presented. It was found, that for relatively clean sample SXEOL and XBIC provide similar information about the recombination activity of defects while for the samples with a high transition metal content there are significant differences in the provided information. The reasons of the revealed XBIC - SXEOL differences are discussed.

  Info
Periodical
Solid State Phenomena (Volumes 178-179)
Chapter
Chapter 8: Defect and Impurity Characterization
Edited by
W. Jantsch and F. Schäffler
Pages
301-306
DOI
10.4028/www.scientific.net/SSP.178-179.301
Citation
M. Trushin, O.F. Vyvenko, W. Seifert, A. Klossek, I. Zizak, M. Kittler, "Scanning X-Ray Excited Optical Luminescence Microscopy as a New Tool for the Analysis of Recombination Active Defects in Multi-Crystalline Silicon", Solid State Phenomena, Vols. 178-179, pp. 301-306, 2011
Online since
August 2011
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: X.P. Zhu, Tsuneo Suzuki, Hisayuki Suematsu, Wei Hua Jiang, Koichi Niihara
Abstract:Nitriding of titanium was achieved in a vacuum of ~2×10-2 Pa by applying intense pulsed ion beam (IPIB) irradiation. Various phases including...
17
Authors: Wei Wei Zhang, Zhi Hua Wang, Hong Wei Ma
Abstract:The objective of this study is to show the potential of the crack detection method based on Wavelet Packet Transform (WPT), which is...
285
Authors: Yun Qiao Wang, Zhong Yi Mei, Yu Qing Fan
Chapter 6: Machining
Abstract:Machining-induced distortion of large monolithic parts with thin walled structures creates problems in aircraft manufacturing industry....
530
Authors: Fatin Syazana Jamaludin, Mohd Faizul Mohd Sabri
Abstract:The aspect ratio of microholes milled on silicon by FIB/SEM milling was investigated with various beam currents and initial depths of mill....
436
Authors: Chen Ying Wang, Shu Ming Yang, Qi Jing Lin, Zhuang De Jiang
Chapter 2: Sensors, Measurement and Detection
Abstract:The accuracy and traceability of measurement at nano-scale are directly related to nano-fabrication. Nanostep is typical structure, so the...
842