Gettering and Defect Engineering in Semiconductor Technology XIV
| Paper Title | Page |
|---|---|
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Electronic Properties of ZnO/Si Heterojunction Prepared by ALD. Authors: Vincent Quemener, Mari Alnes, Lasse Vines, Ola Nilsen, Helmer Fjellvåg, Eduard Monakhov, Bengt G. Svensson |
130 |
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Authors: Vladimir V. Voronkov, Robert Falster, Karsten Bothe, Bianca Lim, Jan Schmidt |
139 |
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IR Studies on VON, CIOI and CICS Defects in Ge-Doped Cz-Si Authors: Charalamos A. Londos, Efstratia N. Sgourou, A. Andrianakis, Andrzej Misiuk, Valentin V. Emtsev, H. Ohyama |
147 |
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Formation of Copper-Related Deep-Level Centers in Irradiated P-Type Silicon Authors: Nikolai Yarykin, Jörg Weber |
154 |
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Towards the Tailoring of P Diffusion Gettering to As-Grown Silicon Material Properties Authors: Jasmin Hofstetter, Jean François Lelièvre, David P. Fenning, Mariana I. Bertoni, Tonio Buonassisi, Carlos del Cañizo |
158 |
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Peculiarities of Formation and Annealing of VO-Related Defects in Ge Doped with Tin Authors: Lyudmila I. Khirunenko, Yurii V. Pomozov, Mikhail G. Sosnin, Nikolay V. Abrosimov, H. Riemann |
166 |
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1207cm-1 Infrared Absorption Band in Carbon-Rich Silicon Crystal Authors: Lin Chen, Xue Gong Yu, Peng Chen, Xin Gu, Jing Gang Lu, De Ren Yang |
172 |
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Boron-Oxygen-Related Defect in Silicon Authors: Lyudmila I. Khirunenko, Yurii V. Pomozov, Mikhail G. Sosnin, A.V. Duvanskii |
178 |
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Hydrogen-Induced Dissociation of the Fe-B Pair in Boron-Doped P-Type Silicon Authors: Chi Kwong Tang, Lasse Vines, Bengt G. Svensson, Eduard Monakhov |
183 |
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Authors: Julien Nicolai, Nelly Burle, Bernard Pichaud |
188 |