Main Theme:

Electron Microscopy XIV

Volume 186
doi: 10.4028/www.scientific.net/SSP.186
Paper Titles published in this Main Theme:
Paper Title Page

3D Imaging of Strengthening Particles in Cr-V-Mo (13HMF) Steel Using FIB/SEM Tomography

Authors: Władysław Osuch, Adam Kruk, Grzegorz Michta, Aleksandra Czyrska-Filemonowicz

41

Three-Dimensional Visualization and Metrology of Nanoparticles in Inconel 718 by Electron Tomography

Authors: Krzysztof Kulawik, Adam Kruk, Beata Dubiel, Aleksandra Czyrska-Filemonowicz

45

Martensitic Transformation in Ti50Ni25Cu25 Shape Memory Alloy Studied by EBSD

Authors: Tomasz Goryczka, Józef Lelątko

49

Investigations of Fine Grained Metallic Materials by Means of Orientation Maps in Transmission Electron Microscope

Authors: Magdalena Bieda

53

Phase Identification in Nickel-Based Superalloys Using EBSD/SEM and Electron Diffraction in STEM

Authors: Bartosz Chmiela, Maria Sozańska, Kinga Rodak

58

High Resolution EBSD/SEM Analysis of PLZT Ferroelectric Crystals in Low Vacuum Conditions - A few Practical Remarks

Authors: Katarzyna Berent, Marek Faryna

62

Study of Silicon Nanoparticles Formation in Silicon Nitride

Authors: Jacek Ratajczak, Krzysztof Hejduk, Marek Lipiński, Tadeusz Piotrowski, Mariusz Płuska, Adam Łaszcz, Andrzej Czerwiński

66

Structural and Chemical Characterization of Al(Ga)N/GaN Quantum Well Structures Grown by Plasma Assisted Molecular Beam Epitaxy

Authors: Jolanta Borysiuk, Piotr Dłużewski, Zbigniew Zytkiewicz, Marta Sobańska, Kamil Kłosek, Bolesław Łucznik

70

Wurtzite-to Amorphous-to Cubic Phase Transition of GaN1-XAsx Alloys with Increasing as Content

Authors: Zuzanna Liliental-Weber, R. dos Reis, A. Levander, Kin M. Yu, Wladek Walukiewicz, S.V. Novikov, C.T. Foxon

74

Study of Oxides Formed in HfO2/Si Structure for High-k Dielectric Applications

Authors: Adam Łaszcz, Andrzej Czerwiński, Jacek Ratajczak, Andrzej Taube, Sylwia Gierałtowska, Ania Piotrowska, Jerzy Kątcki

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Showing 11 to 20 of 78 Paper Titles