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Precipitation of Iron in Silicon: Gettering to Extended Surface Defects Sites

Journal Solid State Phenomena (Volumes 19 - 20)
Volume Gettering and Defect Engineering in Semiconductor Technology
Edited by M. Kittler and H. Richter
Pages 27-32
DOI 10.4028/www.scientific.net/SSP.19-20.27
Authors M.D. de Coteau, Peter R. Wilshaw, Robert J. Falster
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