Gettering of Copper and Nickel in Czochralski Silicon by Oxide Particles: Assessment of Thermal Stability |
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| Journal | Solid State Phenomena (Volumes 19 - 20) |
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| Volume | Gettering and Defect Engineering in Semiconductor Technology |
| Edited by | M. Kittler and H. Richter |
| Pages | 33-38 |
| DOI | 10.4028/www.scientific.net/SSP.19-20.33 |
| Citation | Robert J. Falster et al., 1991, Solid State Phenomena, 19-20, 33 |
| Authors | Robert J. Falster, Z. Laczik, G.R. Booker, Péter Török |
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