Paper Title:
Applications of In Situ Transmission Electron Microscopy to the Characterization of Process-Induced Defects
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 19-20)
Edited by
M. Kittler and H. Richter
Pages
439-448
DOI
10.4028/www.scientific.net/SSP.19-20.439
Citation
M. Reiche, J. Heydenreich, "Applications of In Situ Transmission Electron Microscopy to the Characterization of Process-Induced Defects", Solid State Phenomena, Vols. 19-20, pp. 439-448, 1991
Online since
January 1991
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Price
$32.00
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