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On the Role of Stacking Faults in Copper Precipitation in Silicon

Journal Solid State Phenomena (Volumes 19 - 20)
Volume Gettering and Defect Engineering in Semiconductor Technology
Edited by M. Kittler and H. Richter
Pages 45-50
DOI 10.4028/www.scientific.net/SSP.19-20.45
Authors Michael Seibt
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