Paper Title:
Temperature Profiles Induced by Recrystallization of Silicon-on-Insulator with Scanning Incoherent Light Line Source
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 19-20)
Edited by
M. Kittler and H. Richter
Pages
631-638
DOI
10.4028/www.scientific.net/SSP.19-20.631
Citation
H.H. Richter, H. Andrä, B. Tillack, O. Joachim, W. Weinelt, R. Banisch, K. Hoeppner, "Temperature Profiles Induced by Recrystallization of Silicon-on-Insulator with Scanning Incoherent Light Line Source", Solid State Phenomena, Vols. 19-20, pp. 631-638, 1991
Online since
January 1991
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Price
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