Paper Title:
Peculiarities in the Defect Behavior in Heat-Treated Cz-Si with a Low and High Oxygen Content
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 32-33)
Edited by
H.G. Grimmeiss, M. Kittler and H. Richter
Pages
173-180
DOI
10.4028/www.scientific.net/SSP.32-33.173
Citation
V. V. Emtsev, G. A. Oganesyan, K. Schmalz, "Peculiarities in the Defect Behavior in Heat-Treated Cz-Si with a Low and High Oxygen Content", Solid State Phenomena, Vols. 32-33, pp. 173-180, 1993
Online since
December 1993
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.