EPR Identification of the Different Charge States of the Iron-Acceptor Pairs in Silicon |
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| Journal | Solid State Phenomena (Volumes 32 - 33) |
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| Volume | Gettering and Defect Engineering in Semiconductor Technology |
| Edited by | H.G. Grimmeiss, M. Kittler and H. Richter |
| Pages | 219-224 |
| DOI | 10.4028/www.scientific.net/SSP.32-33.219 |
| Citation | W. Gehlhoff et al., 1993, Solid State Phenomena, 32-33, 219 |
| Online since | December, 1993 |
| Authors | W. Gehlhoff, K. Irmscher |
| Full Paper | 
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