Defect Electrical Activity Study Using a Si(Ge) Heteroepitaxial Structure
| Periodical | Solid State Phenomena (Volumes 32 - 33) |
|---|---|
| Main Theme | Gettering and Defect Engineering in Semiconductor Technology |
| Edited by | H.G. Grimmeiss, M. Kittler and H. Richter |
| Pages | 309-318 |
| DOI | 10.4028/www.scientific.net/SSP.32-33.309 |
| Citation | Zbigniew J. Radzimski et al., 1993, Solid State Phenomena, 32-33, 309 |
| Online since | December, 1993 |
| Authors | Zbigniew J. Radzimski, A. Buczkowski, George A. Rozgonyi |
| Price | US$ 28,- |