Paper Title:
Characterization of MBE Grown Si/Si1-xGex/Si Structures Using n+p-Diodes
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 32-33)
Edited by
H.G. Grimmeiss, M. Kittler and H. Richter
Pages
595-600
DOI
10.4028/www.scientific.net/SSP.32-33.595
Citation
K. Schmalz, H. Rücker, H. G. Grimmeiss, B. Dietrich, H. Frankenfeld, W. Mehr, H.J. Osten, P. Schley, "Characterization of MBE Grown Si/Si1-xGex/Si Structures Using n+p-Diodes", Solid State Phenomena, Vols. 32-33, pp. 595-600, 1993
Online since
December 1993
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Price
$32.00
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