Paper Title:
Investigations on Surface and Bulk Semiconductor Properties Using Wavelength Dependent TRMC Measurements
  Abstract

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Periodical
Solid State Phenomena (Volumes 32-33)
Edited by
H.G. Grimmeiss, M. Kittler and H. Richter
Pages
601-608
DOI
10.4028/www.scientific.net/SSP.32-33.601
Citation
G. Betz, W. Gründler, J. Quick, H. Richter, "Investigations on Surface and Bulk Semiconductor Properties Using Wavelength Dependent TRMC Measurements", Solid State Phenomena, Vols. 32-33, pp. 601-608, 1993
Online since
December 1993
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Price
$32.00
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