Paper Title:
Mapping Interfacial Roughness and Composition in Elemental Semiconductor Systems
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 32-33)
Edited by
H.G. Grimmeiss, M. Kittler and H. Richter
Pages
615-618
DOI
10.4028/www.scientific.net/SSP.32-33.615
Citation
A. Ourmazd, P. Schwander, C. Kisielowski-Kemmerich, M. Seibt, F.H. Baumann, Y.O. Kim, "Mapping Interfacial Roughness and Composition in Elemental Semiconductor Systems", Solid State Phenomena, Vols. 32-33, pp. 615-618, 1993
Online since
December 1993
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Price
$32.00
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