Paper Title:
Investigation of Minority Carrier Diffusion Length in Multicrystalline Silicon by Quantitative Electron Beam Induced Current Mapping
  Abstract

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Periodical
Solid State Phenomena (Volumes 37-38)
Edited by
H.P. Strunk, J.H. Werner, B. Fortin and O. Bonnaud
Pages
189-194
DOI
10.4028/www.scientific.net/SSP.37-38.189
Citation
A. Barhdadi, S. Sivoththaman, M. Barbe, M. Rodot, J.L. Maurice, "Investigation of Minority Carrier Diffusion Length in Multicrystalline Silicon by Quantitative Electron Beam Induced Current Mapping", Solid State Phenomena, Vols. 37-38, pp. 189-194, 1994
Online since
March 1994
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