The Electrical Activity of Dislocations in Edge-Defined Film-Fed Growth Silicon |
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| Journal | Solid State Phenomena (Volumes 37 - 38) |
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| Volume | Polycrystalline Semiconductors III |
| Edited by | H.P. Strunk, J.H. Werner, B. Fortin and O. Bonnaud |
| Pages | 3-12 |
| DOI | 10.4028/www.scientific.net/SSP.37-38.3 |
| Authors | W.D. Sawyer, R.O. Bell, Andreas Schönecker |
| Keywords | Demarcation Energy, Dislocation, Electron Beam Induced Current (EBIC), Spectral Response |
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