The Electrical Activity of Dislocations in Edge-Defined Film-Fed Growth Silicon |
| Journal |
Solid State Phenomena (Volumes 37 - 38) |
| Volume |
Polycrystalline Semiconductors III |
| Edited by |
H.P. Strunk, J.H. Werner, B. Fortin and O. Bonnaud |
| Pages |
3-12 |
| DOI |
10.4028/www.scientific.net/SSP.37-38.3 |
| Citation |
W.D. Sawyer et al., 1994, Solid State Phenomena, 37-38, 3 |
| Authors |
W.D. Sawyer, R.O. Bell, Andreas Schönecker |
| Keywords |
Demarcation Energy, Dislocations, Electron Beam Induced Current (EBIC), Spectral Response |
| Full Paper |
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