Paper Title:
Determination of Crystallisation Parameters of a-Si from In Situ Conductance Measurements and Transmission Electron Microscopy Analysis
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 37-38)
Edited by
H.P. Strunk, J.H. Werner, B. Fortin and O. Bonnaud
Pages
311-316
DOI
10.4028/www.scientific.net/SSP.37-38.311
Citation
T. Kretz, R. Stroh, P. Legagneux, O. Huet, M. Magis, D. Pribat, "Determination of Crystallisation Parameters of a-Si from In Situ Conductance Measurements and Transmission Electron Microscopy Analysis", Solid State Phenomena, Vols. 37-38, pp. 311-316, 1994
Online since
March 1994
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