In Situ Observations of Dislocation Motion in Polycrystalline Silicon during Straining Experiment in a High-Voltage Electron Microscope |
| Journal |
Solid State Phenomena (Volumes 37 - 38) |
| Volume |
Polycrystalline Semiconductors III |
| Edited by |
H.P. Strunk, J.H. Werner, B. Fortin and O. Bonnaud |
| Pages |
47-54 |
| DOI |
10.4028/www.scientific.net/SSP.37-38.47 |
| Citation |
M. Werner et al., 1994, Solid State Phenomena, 37-38, 47 |
| Authors |
M. Werner, Martin Bartsch, U. Messerschmidt, D. Baither |
| Keywords |
Dislocation Motion, In Situ Straining |
| Full Paper |
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