Paper Title:
Hot Carrier Induced Degradation in Polycrystalline Silicon Thin Film Transistors
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 37-38)
Edited by
H.P. Strunk, J.H. Werner, B. Fortin and O. Bonnaud
Pages
583-588
DOI
10.4028/www.scientific.net/SSP.37-38.583
Citation
G. Fortunato, G. Tallarida, A. Pecora, "Hot Carrier Induced Degradation in Polycrystalline Silicon Thin Film Transistors", Solid State Phenomena, Vols. 37-38, pp. 583-588, 1994
Online since
March 1994
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Price
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