Paper Title:
Influence of the Polysilicon Film Structure on the Capacitance Voltage Characteristics of Thin Film Transistors
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 37-38)
Edited by
H.P. Strunk, J.H. Werner, B. Fortin and O. Bonnaud
Pages
589-594
DOI
10.4028/www.scientific.net/SSP.37-38.589
Citation
Z. Benamara, S. Mansouri, H. Sehil, F. Raoult, O. Bonnaud, "Influence of the Polysilicon Film Structure on the Capacitance Voltage Characteristics of Thin Film Transistors", Solid State Phenomena, Vols. 37-38, pp. 589-594, 1994
Online since
March 1994
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Price
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