Defect Structure and Electrical Properties of Cr- and Nb-Doped TiO2 Thin Films |
| Journal |
Solid State Phenomena (Volumes 39 - 40) |
| Volume |
Systems with Fast Ionic Transport - IV |
| Edited by |
Wladyslaw Bogusz, Waclaw Jakubowski and Franciszek Krok |
| Pages |
135-138 |
| DOI |
10.4028/www.scientific.net/SSP.39-40.135 |
| Citation |
M. Radecka et al., 1994, Solid State Phenomena, 39-40, 135 |
| Authors |
M. Radecka, M. Rekas |
| Keywords |
Defect Diagram, Electrical Conductivity, Point Defect, Thin Film, Titanium Oxide |
| Full Paper |
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