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TiN Thin Films Preparation, Structural and Electrical Proberties

Journal Solid State Phenomena (Volumes 39 - 40)
Volume Systems with Fast Ionic Transport - IV
Edited by Wladyslaw Bogusz, Waclaw Jakubowski and Franciszek Krok
Pages 139-142
DOI 10.4028/www.scientific.net/SSP.39-40.139
Citation A. Tarniowy et al., 1994, Solid State Phenomena, 39-40, 139
Authors A. Tarniowy, R. Mania, M. Rekas
Keywords AES, Electrical Conductivity, TEM, Thin Film, Titanium Nitride, X-Ray Diffraction (XRD)
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