Paper Title:
Ellipsometric Studies of a-Si:H Film Growth, Density and Microstructure
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 44-46)
Edited by
Hans Neber-Aeschbacher
Pages
195-226
DOI
10.4028/www.scientific.net/SSP.44-46.195
Citation
U.I. Schmidt, T. Haage, B. Schröder, "Ellipsometric Studies of a-Si:H Film Growth, Density and Microstructure", Solid State Phenomena, Vols. 44-46, pp. 195-226, 1995
Online since
July 1995
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Price
$32.00
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