Effects of Trapping in a-Si:H Diodes |
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| Journal | Solid State Phenomena (Volumes 44 - 46) |
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| Volume | Hydrogenated Amorphous Silicon |
| Edited by | Hans Neber-Aeschbacher |
| Pages | 957-972 |
| DOI | 10.4028/www.scientific.net/SSP.44-46.957 |
| Citation | H. Wieczorek, 1995, Solid State Phenomena, 44-46, 957 |
| Authors | H. Wieczorek |
| Keywords | Diode, Image Sensor, Injection, Noise, Photocurrent, Recombination, Transient Effects, Trapping |
| Full Paper | 
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