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Room Temperature UHV Silicon Direct Bonding

Journal Solid State Phenomena (Volumes 47 - 48)
Volume Gettering and Defect Engineering in Semiconductor Technology VI
Edited by H. Richter, M. Kittler and C. Claeys
Pages 143-152
DOI 10.4028/www.scientific.net/SSP.47-48.143
Citation F. Shi et al., 1995, Solid State Phenomena, 47-48, 143
Authors F. Shi, G. Elssner, Manfred Reiche, U.M. Gösele
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