Paper Title:
The Impact of Fe and Cu Contamination in the 1012 at/cm2 Range on the Performance of Junction Diodes
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 47-48)
Edited by
H. Richter, M. Kittler and C. Claeys
Pages
397-402
DOI
10.4028/www.scientific.net/SSP.47-48.397
Citation
A.L.P. Rotondaro, E. Vandamme, J. Vanhellemont, E. Simoen, M. M. Heyns, C. Claeys, "The Impact of Fe and Cu Contamination in the 1012 at/cm2 Range on the Performance of Junction Diodes", Solid State Phenomena, Vols. 47-48, pp. 397-402, 1996
Online since
July 1995
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Price
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