Paper Title:
Ion Beam Sputter Deposited Si0.8Ge0.2Epilayers: Lattice Defects and Surface Topology
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 47-48)
Edited by
H. Richter, M. Kittler and C. Claeys
Pages
431-436
DOI
10.4028/www.scientific.net/SSP.47-48.431
Citation
V. Demuth, W. Dorsch, H. P. Strunk, M. Lyakas, M. Eizenberg, N. Mosleh, F. Meyer, C. Schwebel, "Ion Beam Sputter Deposited Si0.8Ge0.2Epilayers: Lattice Defects and Surface Topology", Solid State Phenomena, Vols. 47-48, pp. 431-436, 1996
Online since
July 1995
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Price
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